发明名称 DELAY TIME DETERMINING METHOD, DELAY TIME ADJUSTING METHOD AND VARIABLE DELAY CIRCUIT
摘要 <p>A variable delay circuit (1) comprises a multistage delay circuit (20) in which delay elements (D1-Dn) are series connected; a selecting part (21) that selects one of delay signals of different delay amounts obtained by causing a reference clock to pass through one or more of the delay elements (D1-Dn); a determining part (23) that determines, at determination timings synchronous with the reference clock, the signal logics of the sequentially selected ones of the delay signals; and a change point detecting part (24) that detects at least two delay elements (Dm,Dk) exhibiting changes in the logic of the reference clock at the determination timings. The difference (k-m) between a number of delay elements through which a clock signal passes to the detected element (Dm) and a number of delay elements through which the clock signal passes to the detected element (Dk) is used as the number of delay elements with which a desired delay time occurs.</p>
申请公布号 WO2008126292(A1) 申请公布日期 2008.10.23
申请号 WO2007JP57220 申请日期 2007.03.30
申请人 MAEDA, MASAZUMI;FUJITSU LIMITED 发明人 MAEDA, MASAZUMI
分类号 H03K5/153 主分类号 H03K5/153
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