| 摘要 |
<p>Provided is a pronged fork probe tip (100) for probing a node, such as a through-hole node (1900), on a circuit. The probe tip (100) has a shaft (104) made from an electrically conductive material, concentric to a longitudinal probe axis (102), and two fork prongs (106, 108) coupled to the shaft (104) and positioned parallel to the probe axis (102). The two fork prongs (106, 108) provide two geometrically singular points of contact (110, 112), concentrating applied force from the shaft (104) to the node hole (1900), and more particularly, to solder (1904) within the node hole (1900), at two points. A self-cleaning space (116, 600) between the fork prongs (106, 108) aids in preventing clogging of the probe (100) by flux material (1906) and/or debris. The shaft (104) may also include a plunger (1800) and/or a structure to provide a preferred fixed orientation by preventing rotation of the probe (100) about the probe axis (102).</p> |
