| 摘要 |
<p>The present invention related to a far field light microscopical method for analysing at least one object having a subwavelength size in at least one spatial direction to obtain spatial information of the object, in particular size and topology thereof, comprising the steps of:
- labelling the object(s) with a plurality of suitable optical markers, each optical marker having a distinct spectral signature;
- providing illumination light to at least partially illuminate the object(s);
- subjecting the object(s) to the illumination light;
- detecting an optical response of the object(s);
- obtaining spatial information of the object(s),
wherein the step of labelling the object comprises labelling a plurality of elements (E1, E2, E3...E N ) of the object, each element having a subwavelength size, such that each of the elements (E1, E2, E3...E N ) is randomly labelled
such that all elements (E1, E2, E3...E N ) in the plurality are labelled with different optical markers; or
such that at least two one pair of elements is labelled with the same optical marker and all pairs of elements labelled with the same optical marker in the plurality are labelled with different optical markers.</p> |
