| 摘要 |
A fixture for circuit board inspection is provided to exchange easily a contact by using a first guiding plate and a second guiding plate. Each of contacts(2) includes an end as an electrical conductor. One end of each contact is connected to one of test target points of a substrate. Each contact has conductivity. An insulating part is formed at a center of each contact. Each contact has a shape of bar. A contact supporter(3) is formed to support the contacts. The contact supporter includes a first guiding plate(31) having a first guiding hole and a second guiding plate(32) having a second guiding hole. The first guiding plate is used for guiding one end of the contact to the test target points. The second guiding plate is used for guiding the other end of the contact to an electrode part. A connective electrode body is arranged opposite to the contacts. The connective electrode body includes a connective electrode part. The first guiding hole has a diameter smaller than a diameter of the insulating part. The second guiding hole has a diameter larger than the diameter of the insulating part. The second guiding plate has a corresponding state and a supporting state. The second guiding plate is electrically connected to a part of the connective electrode part. |
