发明名称 |
METHOD OF FABRICATING SEMICONDUCTOR DEVICE HAVING LANDING PAD |
摘要 |
<p>A method for forming a semiconductor device having landing pads is provided to maximize efficiency in mass production by patterning an interlayer insulation layer to expose source/drain regions and forming landing pads on the exposed source/drain regions. A method for forming a semiconductor device having landing pads comprises the following steps of: providing a semiconductor substrate(51) including a buried gate electrode(57), a capping pattern for covering the buried gate electrode and source/drain regions(61,62) formed in both sides of the buried gate electrode; forming an interlayer insulation layer for covering the semiconductor substrate; patterning the interlayer insulation layer to form a groove at an upper portion of the buried gate electrode; forming an insulation pattern(67) for filling the groove; patterning the interlayer insulation layer at both sides of the insulation pattern to expose the source/drain regions; and forming landing pads on the exposed source/drain regions.</p> |
申请公布号 |
KR20080090171(A) |
申请公布日期 |
2008.10.08 |
申请号 |
KR20070033350 |
申请日期 |
2007.04.04 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, SANG WOOK;KIM, DONG HYUN;SHIN, SOO HO;KIM, SEONG GOO |
分类号 |
H01L21/336;H01L21/28;H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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