发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE HAVING LANDING PAD
摘要 <p>A method for forming a semiconductor device having landing pads is provided to maximize efficiency in mass production by patterning an interlayer insulation layer to expose source/drain regions and forming landing pads on the exposed source/drain regions. A method for forming a semiconductor device having landing pads comprises the following steps of: providing a semiconductor substrate(51) including a buried gate electrode(57), a capping pattern for covering the buried gate electrode and source/drain regions(61,62) formed in both sides of the buried gate electrode; forming an interlayer insulation layer for covering the semiconductor substrate; patterning the interlayer insulation layer to form a groove at an upper portion of the buried gate electrode; forming an insulation pattern(67) for filling the groove; patterning the interlayer insulation layer at both sides of the insulation pattern to expose the source/drain regions; and forming landing pads on the exposed source/drain regions.</p>
申请公布号 KR20080090171(A) 申请公布日期 2008.10.08
申请号 KR20070033350 申请日期 2007.04.04
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, SANG WOOK;KIM, DONG HYUN;SHIN, SOO HO;KIM, SEONG GOO
分类号 H01L21/336;H01L21/28;H01L29/78 主分类号 H01L21/336
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