发明名称 Method for measuring surface plasmon resonance
摘要 <p>An object of the present invention is to suppress the noise width of a reference cell during measurement and the base line fluctuation. The present invention provides a method for measuring a change in surface plasmon resonance, which comprises: using a surface plasmon resonance measurement device (10) comprising a flow channel system having a cell formed on a metal film (12) and a light-detecting means (40) for detecting the state of surface plasmon resonance by measuring the intensity of a light beam totally reflected on the metal film (12); and exchanging the liquid contained in the above flow channel system, wherein the above method is characterized in that a change in surface plasmon resonance is measured in a state where the flow of the liquid has been stopped, after the liquid contained in the above flow channel system has been exchanged.</p>
申请公布号 EP1978350(A2) 申请公布日期 2008.10.08
申请号 EP20080012532 申请日期 2004.12.02
申请人 FUJIFILM CORPORATION 发明人 KURUMA, KOJI;TSUZUKI, HIROHIKO
分类号 G01N21/55;G01N21/27;G01N21/05;G01N33/543 主分类号 G01N21/55
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