发明名称 |
Method for measuring surface plasmon resonance |
摘要 |
<p>An object of the present invention is to suppress the noise width of a reference cell during measurement and the base line fluctuation. The present invention provides a method for measuring a change in surface plasmon resonance, which comprises: using a surface plasmon resonance measurement device (10) comprising a flow channel system having a cell formed on a metal film (12) and a light-detecting means (40) for detecting the state of surface plasmon resonance by measuring the intensity of a light beam totally reflected on the metal film (12); and exchanging the liquid contained in the above flow channel system, wherein the above method is characterized in that a change in surface plasmon resonance is measured in a state where the flow of the liquid has been stopped, after the liquid contained in the above flow channel system has been exchanged.</p> |
申请公布号 |
EP1978350(A2) |
申请公布日期 |
2008.10.08 |
申请号 |
EP20080012532 |
申请日期 |
2004.12.02 |
申请人 |
FUJIFILM CORPORATION |
发明人 |
KURUMA, KOJI;TSUZUKI, HIROHIKO |
分类号 |
G01N21/55;G01N21/27;G01N21/05;G01N33/543 |
主分类号 |
G01N21/55 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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