发明名称 Self-aligned manufacturing method, and manufacturing method for thin film fuse phase change ram
摘要 A method for manufacturing a self aligned narrow structure over a wider structure based on mask trimming. A method for manufacturing a memory device comprises forming an electrode layer on a substrate which comprises circuitry made using front-end-of-line procedures. The electrode layer includes a first electrode and a second electrode, and an insulating member between the first and second electrodes for each phase change memory cell to be formed. A patch of memory material is formed on the top surface of the electrode layer across the insulating member for each memory cell to be formed. The patch and the first and second electrodes are formed using a self-aligned process based on mask trimming.
申请公布号 US7432206(B2) 申请公布日期 2008.10.07
申请号 US20060338285 申请日期 2006.01.24
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUNG HSIANG LAN
分类号 H01L21/311 主分类号 H01L21/311
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