发明名称 Nanoimprint resist
摘要 The invention relates to a method for microstructuring electronic components, which yields high resolutions (<=200 nm) at a good aspect ratio while being significantly less expensive than photolithographic methods. The inventive method comprises the following steps: i) a planar unhardened sol film of a nanocomposite composition according to claim 1 is produced; ii) a target substrate consisting of a bottom coat (b) and a support (c) is produced; iii) sol film material obtained in step i) is applied to the bottom coat (b) obtained in step ii) by means of a microstructured transfer embossing stamp; iv) the applied sol film material is hardened; v) the transfer embossing stamp is separated, whereby an embossed microstructure is obtained as a top coat (a). The method for producing a microstructured semiconductor material comprises the following additional steps: vi) the remaining layer of the nanocomposite sol film is plasma etched, preferably with CHF<SUB>3</SUB>/O<SUB>2 </SUB>plasma; vii) the bottom coat is plasma etched, preferably with O<SUB>2 </SUB>plasma; viii) the semiconductor material is etched or the semiconductor material is doped in the etched areas.
申请公布号 US7431858(B2) 申请公布日期 2008.10.07
申请号 US20050511402 申请日期 2005.05.03
申请人 AZ ELECTRONIC MATERIALS (GERMANY) GMBH 发明人 SPIESS WALTER;KITA FUMIO;MEIER MICHAEL;GIER ANDREAS;MENNIG MARTIN;OLIVEIRA PETER W;SCHMIDT HELMUT
分类号 B44C1/22;G03F7/20;B81C1/00;C03C15/00;C03C25/68;C23F1/00;G03F7/00;G03F7/004;G03F7/075;H01L21/027;H01L21/3065 主分类号 B44C1/22
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