| 摘要 |
PROBLEM TO BE SOLVED: To provide a sensor element capable of accurately detecting the location of flaw of a test specimen and of reducing the time required for the manufacturing time, and to provide an eddy current flaw detection probe. SOLUTION: The sensor element comprises an excitation coil 8 for forming an alternating magnetic field by an alternating current supplied and exciting an eddy current in the test specimen, and a detection coil 9 for detecting the magnetic field by the eddy current, in which the excitation coil 8 and the detection coil 9 are respectively formed on a plate-like sensor substrate, having insulation properties, and the sensor substrate is layered in a state of being aligned in arranged positions of the exciting coil 8 and the detection coil 9. COPYRIGHT: (C)2008,JPO&INPIT
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