HIGH THROUGHPUT SEM TOOL

摘要

A multi-beam scanning electron beam device is described. The multi-beam scanning electron beam device having a column, includes a multi-beam emitter for emitting a plurality of electron beams, at least one common electron beam optical element having a common opening for at least two of the plurality of electron beams and being adapted for commonly influencing at least two of the plurality of electron beams, at least one individual electron beam optical element for individually influencing the plurality of electron beams, a common objective lens assembly for focusing the plurality of electrons beams having a common excitation for focusing at least two of the plurality of electron beams, and adapted for focusing the plurality of electron beams onto a specimen for generation of a plurality of signal beams, and a detection assembly for individually detecting each signal beam on a corresponding detection element.