发明名称 SEMICONDUCTOR DIE WITH SEPARATION TRENCH ETCH AND PASSIVATION
摘要 A trench is etched into a scribe path (110) located between integrated circuit dies (105) formed on a semiconductor wafer (100). The etching is conducted to a depth within the semiconductor wafer that extends beyond a depth of circuitry (103) and forms an edge of the die on which a passivation layer is placed. A back surface of the wafer (100) is removed until it intersects the trench. This separates the dies from the wafer, without removing the passivation layer from die edges.
申请公布号 WO2008079691(A3) 申请公布日期 2008.08.28
申请号 WO2007US87199 申请日期 2007.12.12
申请人 TEXAS INSTRUMENTS INCORPORATED;LYNE, KEVIN, P. 发明人 LYNE, KEVIN, P.
分类号 H01L21/4763 主分类号 H01L21/4763
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