发明名称 |
SEMICONDUCTOR DIE WITH SEPARATION TRENCH ETCH AND PASSIVATION |
摘要 |
A trench is etched into a scribe path (110) located between integrated circuit dies (105) formed on a semiconductor wafer (100). The etching is conducted to a depth within the semiconductor wafer that extends beyond a depth of circuitry (103) and forms an edge of the die on which a passivation layer is placed. A back surface of the wafer (100) is removed until it intersects the trench. This separates the dies from the wafer, without removing the passivation layer from die edges.
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申请公布号 |
WO2008079691(A3) |
申请公布日期 |
2008.08.28 |
申请号 |
WO2007US87199 |
申请日期 |
2007.12.12 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED;LYNE, KEVIN, P. |
发明人 |
LYNE, KEVIN, P. |
分类号 |
H01L21/4763 |
主分类号 |
H01L21/4763 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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