| 摘要 |
A high-speed signal testing system that includes a digital circuitry for providing a pattern tester with oscilloscope functionality at minimal implementation cost. The digital circuitry includes a time -base generator that provides a high-speed repeating time-base signal. The time-base signal, in conjunction with a sub-sampler and an accumulation memory, allows the system to zoom in on, and analyze portions of, one or more bits of interest in a repeating pattern present on the signal under test. Such portions of interest include rising and falling edges and constant high and low bit values. |
