| 摘要 |
<P>PROBLEM TO BE SOLVED: To improve luminance unevenness due to characteristic variance of a sampling transistor in an organic EL display device. <P>SOLUTION: Based upon pixel circuits P with 2TR constitution including a holding capacitor 120, a driving transistor 121, and a sampling transistor 125, the sampling transistor 125 is divided into a plurality of pieces and disposed on each pixel circuit P. For annealing processing, a scanning direction, an irradiation width, and a scan pitch are set to match arrangement configuration of the sampling transistors 125a and 125b. Preferably, single-time irradiation widths Pa to Pd in the annealing processing are set wider than the array pitch of the sampling transistors 125a and 125b in the array direction of the sampling transistors 125a and 125b divided into the plurality of pieces. <P>COPYRIGHT: (C)2008,JPO&INPIT |
