发明名称 PROBE AND PROBE ASSEMBLY
摘要 PROBLEM TO BE SOLVED: To provide a probe capable of reliably preventing electric shorts between adjacent probes and relatively easily manufactured. SOLUTION: The probe includes a probe body made of a plate-like member having a mounting region with a mounting end and extending in the direction separating from the mounting end; an arm region extending from the mounting region in the direction intersecting the extending direction of the mounting region; and a needle tip region intersecting the longitudinal direction of the arm region from the arm region, extending to the side of the mounting region opposite to its side on which the mounting end is located when viewed from the arm region, and provided with a needle tip at its extending end. An insulating film made of a photosensitive electric insulating material for exposing the mounting end of the mounting region is formed in at least one surface of the probe. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008196914(A) 申请公布日期 2008.08.28
申请号 JP20070031094 申请日期 2007.02.09
申请人 MICRONICS JAPAN CO LTD 发明人 YAMADA YUKO;HIRAKAWA HIDEKI;TAZAWA MASAHISA;HAYASHIZAKI TAKAYUKI
分类号 G01R1/067;H01L21/66 主分类号 G01R1/067
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