发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE HAVING DUAL-FREE SILICIDED GATE
摘要 PROBLEM TO BE SOLVED: To provide a better method for manufacturing a semiconductor device, more specifically, a semiconductor device of a dual work function having dual-free silicided (FUSI) metal gate. SOLUTION: The manufacturing method of a dual work function semiconductor device has a step for providing a first metal layer 108 on the first electrode 102a in a first region 101a, and at least a first work-function modulated element. Furthermore, the second metal layer 109 of a second metal is formed at least on the second electrode 102b in a second region 101b, and the first silicidation of the first electrode 102a is performed synchronously with the second silicidation of the second electrode 102b. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008198986(A) 申请公布日期 2008.08.28
申请号 JP20070309121 申请日期 2007.11.29
申请人 INTERUNIV MICRO ELECTRONICA CENTRUM VZW;TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD 发明人 CHANG SHOU-ZEN;YU HONG YU
分类号 H01L21/8238;H01L21/28;H01L27/092;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/8238
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