| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of configuring a high-reliability replica circuit in a flexible and more efficient manner, and to provide a method for the same. SOLUTION: A semiconductor device comprises a semiconductor circuit 11, having a transfer path and a replica circuit 16C for making a reference signal propagate to monitor a delay time of a critical path of the semiconductor circuit. The replica circuit 16C includes a plurality of replica portions 16A-1, 16A-2 including delay elements, a selector 191 which connects the plurality of replica portions, in parallel or in series with an input of a reference signal SIN upon receiving a selected signal; and an AND gate 192, which selects the output signal of a delay element with a more delay amount, from among outputs of the plurality of replica portions, as a signal for monitoring. COPYRIGHT: (C)2008,JPO&INPIT
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