DEVICES FOR EVALUATING MATERIAL PROPERTIES, AND RELATED PROCESSES

摘要

A device for measuring at least one property of a material sample is disclosed. The device includes at least one sensor element which is formed by a direct-write technique. The device can be an instrument for measuring strain in the sample, or for measuring other properties or attributes of a sample, such as temperature. A turbine engine disk on which components of property-measuring devices have been direct-written is also described. Methods of forming sensor elements for property-measuring devices are disclosed.