| 摘要 |
PROBLEM TO BE SOLVED: To provide an addition filter measuring a half-value layer in a shorter time, a half-value layer measuring instrument using it and a half-value layer measuring method. SOLUTION: A gauge part having a plurality of regions respectively made different in thickness dimension is provided to the half-value layer measuring addition filter, which is arranged on the side of the X-ray source of a dose detection means for detecting the dose of X rays emitted from an X-ray source, in a thickness direction being an X-ray transmission direction. The thickness of the half-value layer of X rays is measured by the step of arranging the addition filter on the side of the X-ray source of the dose detection means and the step of irradiating the dose detection means with X rays to detect the dose of X rays and setting the thickness of the addition filter for measuring the half-value layer becoming a predetermined attenuation ratio in dose as the thickness of the half-value layer. COPYRIGHT: (C)2008,JPO&INPIT
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