发明名称 PLASMA ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To perform etching without penetrating an etching stop film and stopping on the way, even when a space between the ends of holes is 10μm or larger or narrow around 0.1μm, when a substrate to be etched containing silicon and carbon is subjected to plasma etching and make a hole. SOLUTION: When over-etching is performed after main etching, a raw gas containing carbon and fluorine is changed into a plasma, and a negative DC voltage is applied to an upper electrode provided facing a substrate. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008198659(A) 申请公布日期 2008.08.28
申请号 JP20070029580 申请日期 2007.02.08
申请人 TOKYO ELECTRON LTD 发明人 YOSHIDA RYOICHI
分类号 H01L21/3065;H01L21/768 主分类号 H01L21/3065
代理机构 代理人
主权项
地址