| 摘要 |
Methods and assemblies for ion detection in samples using a chip with elevated sample zones, also known as a "pillar chip." Methods include analyzing such a sample by desorbing a sample from a chip, producing a described ion sample and detecting the same. The chip comprises a base having a surface and one or more structures protruding above the surface of the base. Each structure comprises a pillar and a sample zone, the latter containing a support material and the sample to be analyzed. Assemblies include a chip such as that described above and a conductive element that comprises an aperture of sufficient proportion to allow passage of a molecular ion and that is adapted to be at a different electrical potential than the base of the chip.
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