发明名称 EMBEDDED RESISTIVE THIN FILM LAYER AND DEPOSITION METHOD THEREOF ONTO SUBSTRATE TO BE DEPOSITED
摘要 A resistive thin film layer and a deposition method thereof are provided to realize a relatively high electricity resistance property and a relatively low heat resistance coefficient property by distributing uniformly a noble metal of nano-meter size within a tantalum nitride thin film. An embedded resistive thin film layer, in which a noble metal of nano-meter size is distributed uniformly, is provided to a Ta-N parent material. The embedded resistive thin film, which has a relatively high electric resistance property and relatively low heat resistance coefficient property, is deposited on the surface of a substrate. Wherein, a tantalum nitride layer is formed by deposing the Ta-N on the surface of the substrate. And a noble metal is deposited as a particle state of nano-meter size, so as to be distributed uniformly within the tantalum nitride layer.
申请公布号 KR20080054572(A) 申请公布日期 2008.06.18
申请号 KR20060126976 申请日期 2006.12.13
申请人 SUH, SOO JEONG 发明人 PARK, IN SOO;JEONG, KEUN HEE;PARK, SE YOUNG;NA, SEOK MIN;SUH, SOO JEONG
分类号 H01L21/20;H01L21/203;H01L21/263 主分类号 H01L21/20
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