发明名称 |
EMBEDDED RESISTIVE THIN FILM LAYER AND DEPOSITION METHOD THEREOF ONTO SUBSTRATE TO BE DEPOSITED |
摘要 |
A resistive thin film layer and a deposition method thereof are provided to realize a relatively high electricity resistance property and a relatively low heat resistance coefficient property by distributing uniformly a noble metal of nano-meter size within a tantalum nitride thin film. An embedded resistive thin film layer, in which a noble metal of nano-meter size is distributed uniformly, is provided to a Ta-N parent material. The embedded resistive thin film, which has a relatively high electric resistance property and relatively low heat resistance coefficient property, is deposited on the surface of a substrate. Wherein, a tantalum nitride layer is formed by deposing the Ta-N on the surface of the substrate. And a noble metal is deposited as a particle state of nano-meter size, so as to be distributed uniformly within the tantalum nitride layer.
|
申请公布号 |
KR20080054572(A) |
申请公布日期 |
2008.06.18 |
申请号 |
KR20060126976 |
申请日期 |
2006.12.13 |
申请人 |
SUH, SOO JEONG |
发明人 |
PARK, IN SOO;JEONG, KEUN HEE;PARK, SE YOUNG;NA, SEOK MIN;SUH, SOO JEONG |
分类号 |
H01L21/20;H01L21/203;H01L21/263 |
主分类号 |
H01L21/20 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|