发明名称 Apparatus for mass analysis of ions
摘要 <p>An apparatus for mass analysis of ions comprises a high current ion source (10), in particular an ion source providing at least 5 million ions/s, preferably at least 50 million ions/s, at an output of the ion source, a time-of-flight mass spectrometer (40) for analysis of ions transmitted from the ion source (10) and a filter (20) for segmenting incoming ions according to their m/q ratio into a first group of ions and into a second group of ions. The filter (20) is coupled to the ion source (10) and the filter (20) and the time-of-flight mass spectrometer are arranged in such a way that the ions of the first group are transmitted to the mass spectrometer (40) and that the ions of the second group are not transmitted to the mass spectrometer (40). Furthermore, the filter (20) is designed in such a way that the second group consists of ions belonging to one or several narrow bands of m/q. The apparatus allows for analyzing minor compound ions generated by the high current ion source (10) with good selectivity, undisturbed by major compounds.</p>
申请公布号 EP1933366(A1) 申请公布日期 2008.06.18
申请号 EP20070405338 申请日期 2007.11.28
申请人 TOFWERK AG 发明人 KOZLOVSKI, VIATCHESLAV IVANOVICH;FUHRER, KATRIN;GONIN, MARC
分类号 H01J49/42;H01J49/40 主分类号 H01J49/42
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