发明名称 Semiconductor integrated circuit device and semiconductor integrated circuit system
摘要 A semiconductor integrated circuit device according to the present invention includes: a sample circuit in which through current to be monitored flows during switching between transistors; a non-overlap circuit for outputting an output signal for the switching in the sample circuit; a current detector for detecting the through current flowing during the switching; and a current comparator in which a reference current value with respect to the through current has been set and which compares a current value detected by the current detector with the reference current value and outputs a result of the comparison to the non-overlap circuit.
申请公布号 US7388411(B2) 申请公布日期 2008.06.17
申请号 US20070797951 申请日期 2007.05.09
申请人 MATSUSHIITA ELECTRIC INDUSTRIAL CO., LTD. 发明人 ARAKI YUTA;TANAKA ISAO;SUMITA MASAYA
分类号 H03B1/00;H02H3/08;H03K3/00;H03K19/00 主分类号 H03B1/00
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