发明名称 |
Semiconductor integrated circuit device and semiconductor integrated circuit system |
摘要 |
A semiconductor integrated circuit device according to the present invention includes: a sample circuit in which through current to be monitored flows during switching between transistors; a non-overlap circuit for outputting an output signal for the switching in the sample circuit; a current detector for detecting the through current flowing during the switching; and a current comparator in which a reference current value with respect to the through current has been set and which compares a current value detected by the current detector with the reference current value and outputs a result of the comparison to the non-overlap circuit.
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申请公布号 |
US7388411(B2) |
申请公布日期 |
2008.06.17 |
申请号 |
US20070797951 |
申请日期 |
2007.05.09 |
申请人 |
MATSUSHIITA ELECTRIC INDUSTRIAL CO., LTD. |
发明人 |
ARAKI YUTA;TANAKA ISAO;SUMITA MASAYA |
分类号 |
H03B1/00;H02H3/08;H03K3/00;H03K19/00 |
主分类号 |
H03B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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