发明名称 Nonvolatile semiconductor memory and manufacturing method for the same
摘要 The memory cell matrix encompasses (a) a plurality device isolation films running along column direction, (b) first conductive layers arranged along row and column-directions, adjacent groups of the first conductive layers are isolated from each other by the device isolation film disposed between the adjacent groups, (c) lower inter-electrode dielectrics arranged respectively on crests of the corresponding first conductive layers, (d) an upper inter-electrode dielectric arranged on the lower inter-electrode dielectric made of insulating material different from the lower inter-electrode dielectrics, and (e) second conductive layers running along the row-direction, arranged on the upper inter-electrode dielectric.
申请公布号 US7387934(B2) 申请公布日期 2008.06.17
申请号 US20050267331 申请日期 2005.11.07
申请人 发明人
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
主权项
地址