发明名称 Apparatus for treating wafer
摘要 An apparatus for treating a wafer preferably includes a rotating chuck for rotating the wafer and a treating fluid supplying part for supplying the wafer with one or more treating fluids. The treating fluid(s) can be used to clean and/or dry the wafer. The treating fluid supplying part preferably includes a receiving portion for receiving a treating fluid, and a slit communicating with the receiving portion for applying the treating fluid to a surface of the wafer. An ultrasonic oscillating part can be installed in the receiving portion and can apply ultrasonic oscillation to the treating fluid. The treating fluid for applying the ultrasonic oscillation is preferably provided uniformly across the treated surface of the wafer. The effectiveness of the cleaning process can thereby be improved, and damage to patterns formed on the wafer can be reduced.
申请公布号 US7387132(B2) 申请公布日期 2008.06.17
申请号 US20030437594 申请日期 2003.05.13
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 PARK JONG-CHUL
分类号 B08B3/00;H01L21/304;B08B3/12;H01L21/00 主分类号 B08B3/00
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