发明名称 Split-reference, two-pass mark-compaction
摘要 A heap may be marked and compacted while performing only two passes over the objects and object references in the heap. Specifically, objects and object references are traversed once during a marking phase and again during a compaction phase of split-reference, two-pass mark-compaction. Object references are updated in two steps. First, during marking, each object reference may be updated to include the relative offset within its block of the referenced object and-during compaction that offset may be added to the block's destination address resulting in a reference that points to the actual post-compaction location for the referenced object. Objects of a particular block may be rearranged, or permuted, with respect to each other within the block. However, the order between groups of objects in different blocks may be preserved across compaction.
申请公布号 US7389395(B1) 申请公布日期 2008.06.17
申请号 US20050169983 申请日期 2005.06.26
申请人 SUN MICROSYSTEMS, INC. 发明人 GARTHWAITE ALEXANDER T.;STOUTAMIRE DAVID P.;KESSLER PETER B.;RAMAKRISHA Y SRINIVAS;DETLEFS DAVID L.;PRINTEZIS ANTONIOS;MASAMITSU JON A.;COOMES JOHN W.
分类号 G06F12/00 主分类号 G06F12/00
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