发明名称 Subsurface imaging using an electron beam
摘要 A method of navigating or endpointing a microscopic structure by subsurface imaging using a beam of electrons having sufficient energy to penetrate the surface and produce a subsurface image. For endpointing, when the subsurface image become relatively clear at a known electron energy, a user knows that he is approaching the buried feature. For navigating, a subsurface image can be formed of fiducials or other features to determine the position of the beam on the device.
申请公布号 US7388218(B2) 申请公布日期 2008.06.17
申请号 US20050098578 申请日期 2005.04.04
申请人 FEI COMPANY 发明人 CARLESON PETER D.
分类号 H01J49/00 主分类号 H01J49/00
代理机构 代理人
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