| 摘要 |
PROBLEM TO BE SOLVED: To measure an electrical characteristic of a plurality of semiconductor devices supported by a frame at once, and to increase efficiency of a testing process. SOLUTION: An electrical tester holds, with the frame 1, the plurality of lead insert type semiconductor devices 2 sealed by resin, and measures the electrical characteristic of the semiconductor devices 2 in this state. The electrical tester of the lead insert type semiconductor devices comprises a plurality of flat electrodes 12 having terminals 11 simultaneously contactable with the lead 3 of each of the semiconductor devices 2, insulating sheets 13 arranged among these electrodes 12, a fixture for supporting the electrodes 12 and insulating sheets 13 from both sides in the stacking direction, and a tester 19 connected to the electrodes 12. COPYRIGHT: (C)2007,JPO&INPIT
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