发明名称 Semiconductor integrated circuit having multiple semiconductor chips with signal terminals
摘要 A semiconductor integrated circuit includes: a package; semiconductor chips in the package including a signal terminal; and a wiring connecting signal terminals. One semiconductor chip is a test object chip including a probe terminal and a test object terminal. The probe terminal connects to an external terminal for testing the test object terminal. The test object chip further includes: a common wiring for connecting the probe terminal and the test object terminal; a first switch for connecting/disconnecting the probe terminal and the common wiring; a second switch for connecting/disconnecting the test object terminal and the common wiring; and a test signal interrupting element for interrupting the test signal to be inputted into an input circuit of the probe terminal.
申请公布号 US2007108998(A1) 申请公布日期 2007.05.17
申请号 US20060586560 申请日期 2006.10.26
申请人 DENSO CORPORATION 发明人 ITO NAOKI;ISHIHARA HIDEAKI;TESHIMA YOSHINORI;KOBAYASHI CHIKARA
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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