发明名称 ELECTROMAGNETIC WAVE IMAGING SYSTEM, FLUOROSCOPIC DEVICE OF STRUCTURE AND FLUOROSCOPIC METHOD OF STRUCTURE
摘要 PROBLEM TO BE SOLVED: To fluoroscopically inspect the deteriorated place formed in a structure in a more improved S/N ratio by removing the dust and moisture on the surface of the structure. SOLUTION: This electromagnetic wave imaging system of a milli-wave band is equipped with: an air blower for sending hot air to the surface of the structure; an electromagnetic wave generator for irradiating the structure with an electromagnetic wave of the mill-wave band; a unidimensional detector array for detecting the reflected wave of the electromagnetic wave of the milli-band; a measuring instrument 2 for numeralizing the intensity of the reflected wave detected by the unidimensional detector array; and a display device 3 for displaying the fluoroscopic image of a corresponding structure of the transfer distance measured by the distance sensor and the intensity of the reflected wave numeralized by the measuring instrument. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007121220(A) 申请公布日期 2007.05.17
申请号 JP20050317009 申请日期 2005.10.31
申请人 NIPPON TELEGR & TELEPH CORP <NTT>;NTT ADVANCED TECHNOLOGY CORP 发明人 OKA SOICHI;UCHINO TOMIO
分类号 G01N22/02;G01N22/00 主分类号 G01N22/02
代理机构 代理人
主权项
地址