发明名称 |
ELECTROMAGNETIC WAVE IMAGING SYSTEM, FLUOROSCOPIC DEVICE OF STRUCTURE AND FLUOROSCOPIC METHOD OF STRUCTURE |
摘要 |
PROBLEM TO BE SOLVED: To fluoroscopically inspect the deteriorated place formed in a structure in a more improved S/N ratio by removing the dust and moisture on the surface of the structure. SOLUTION: This electromagnetic wave imaging system of a milli-wave band is equipped with: an air blower for sending hot air to the surface of the structure; an electromagnetic wave generator for irradiating the structure with an electromagnetic wave of the mill-wave band; a unidimensional detector array for detecting the reflected wave of the electromagnetic wave of the milli-band; a measuring instrument 2 for numeralizing the intensity of the reflected wave detected by the unidimensional detector array; and a display device 3 for displaying the fluoroscopic image of a corresponding structure of the transfer distance measured by the distance sensor and the intensity of the reflected wave numeralized by the measuring instrument. COPYRIGHT: (C)2007,JPO&INPIT
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申请公布号 |
JP2007121220(A) |
申请公布日期 |
2007.05.17 |
申请号 |
JP20050317009 |
申请日期 |
2005.10.31 |
申请人 |
NIPPON TELEGR & TELEPH CORP <NTT>;NTT ADVANCED TECHNOLOGY CORP |
发明人 |
OKA SOICHI;UCHINO TOMIO |
分类号 |
G01N22/02;G01N22/00 |
主分类号 |
G01N22/02 |
代理机构 |
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代理人 |
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