发明名称 Phase Change Memory Device and Manufacturing Method
摘要 A phase change memory device comprises a photolithographically formed phase change memory cell having first and second electrodes and a phase change element positioned between and electrically coupling the opposed contact elements of the electrodes to one another. The phase change element has a width, a length and a thickness. The length, the thickness and the width are less than a minimum photolithographic feature size of the process used to form the phase change memory cell. The size of the photoresist masks used in forming the memory cell may be reduced so that the length and the width of the phase change element are each less than the minimum photolithographic feature size.
申请公布号 US2007109843(A1) 申请公布日期 2007.05.17
申请号 US20070621390 申请日期 2007.01.09
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUNG HSIANG LAN;CHEN SHIH-HUNG
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
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