| 摘要 |
A memory device has a scratch control array of non-volatile memory cells that is separate from the primary array of memory cells. The scratch control array stores an instruction sequence for execution by the memory device's controller circuit. The sequence can include instructions for testing of the memory device. The execution of the instruction sequence is initiated and the control circuit fetches each instruction from the scratch control array for execution. The results are then reported and/or stored in the scratch control array.
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