发明名称 SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, LIQUID CRYSTAL DISPLAY DEVICE, RFID TAG, LIGHT EMITTING DEVICE, AND ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device, in which characteristics of the semiconductor device are improved by thinning a gate insulating film and a leakage current can be reduced, and a manufacturing method thereof. SOLUTION: An aluminum film 121a which is a metal film is formed on a polycrystalline semiconductor film 103a, and plasma oxidizing treatment is performed to the aluminum film, whereby an aluminum oxide film 104 is formed by oxidizing the aluminum film, and a silicon oxide film 100a is formed between the polycrystalline semiconductor film 103a and the aluminum oxide film. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007123849(A) 申请公布日期 2007.05.17
申请号 JP20060257064 申请日期 2006.09.22
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 KAKEHATA TETSUYA
分类号 H01L21/336;G02F1/1368;H01L21/20;H01L21/283;H01L29/423;H01L29/49;H01L29/786;H01L51/50 主分类号 H01L21/336
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