发明名称 THICKNESS MEASURING DEVICE AND THICKNESS MEASURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a thickness measuring device and a thickness measuring method for measuring film thickness accurately with a simple constitution. SOLUTION: A film thickness measurement result measured by a film thickness sensor 12 is corrected, based on a comparison result between a distance difference based on a measurement result of each distance from each surface of a plurality of standard members 14A, 14B having each different thickness inserted so as to be placed on a measuring object member 18 placed on a reference member 16 to the surface of the reference member 16, and a distance difference from each surface of the plurality of standard members 14A, 14B to the surface of the reference member 16 measured beforehand under a specific environmental condition by the thickness measuring device 10. COPYRIGHT: (C)2007,JPO&INPIT
申请公布号 JP2007120954(A) 申请公布日期 2007.05.17
申请号 JP20050309347 申请日期 2005.10.25
申请人 FUJI XEROX CO LTD 发明人 SUZUKI TETSUKI
分类号 G01B5/06;G01B21/08 主分类号 G01B5/06
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