发明名称 Method of estimating trap from spectral reflectance factor
摘要 A method of estimating the trap of an overprint of at least two primary colors from the spectral density curve of the overprint by computing the amounts of the two primary colors that will produce a spectral density curve that matches the spectral density curve of the overprint, and then relating the amounts to one another. Also disclosed is a printing method that utilizes the trap estimation method. It is emphasized that this abstract is provided to comply with the rules requiring an abstract which will allow a searcher or other reader quickly to ascertain the subject matter of the technical disclosure. It is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the appended issued claims. 37 CFR § 1.72(b).
申请公布号 US2007109566(A1) 申请公布日期 2007.05.17
申请号 US20050273227 申请日期 2005.11.14
申请人 SUN CHEMICAL CORPORATION 发明人 RICH DANNY C.
分类号 G06F15/00 主分类号 G06F15/00
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