发明名称 Spacer Electrode Small Pin Phase Change Memory RAM and Manufacturing Method
摘要 A memory device comprising a first pan-shaped electrode having a side wall with a top side, a second pan-shaped electrode having a side wall with a top side and an insulating wall between the first side wall and the second side wall. The insulating wall has a thickness between the first and second side walls near the respective top sides. A bridge of memory material crosses the insulating wall, and defines an inter-electrode path between the first and second electrodes across the insulating wall. An array of such memory cells is provided. The bridges of memory material have sub-lithographic dimensions.
申请公布号 US2007108077(A1) 申请公布日期 2007.05.17
申请号 US20060424123 申请日期 2006.06.14
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUNG HSIANG L.;CHEN SHIH H.
分类号 B65D85/575 主分类号 B65D85/575
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