发明名称 SEMICONDUCTOR STORAGE DEVICE AND ITS MANUFACTURING METHOD
摘要 <p>A drain (7) comprises a lightly-doped shallow impurity region (7a) aligned with a control gate (5), and a heavily-doped deep impurity region (7b) aligned with a sidewall film (8) and doped with impurities at a concentration higher than that of the lightly-doped shallow impurity region (7a). The lightly-doped shallow impurity region (7a) leads to improvement of the short-channel effect and programming efficiency. A drain contact hole forming portion (70) is provided to the heavily-doped impurity region (7b) to reduce the contact resistance at the drain (7). &lt;IMAGE&gt;</p>
申请公布号 KR100718903(B1) 申请公布日期 2007.05.17
申请号 KR20057003251 申请日期 2005.02.25
申请人 发明人
分类号 H01L27/10;H01L21/8234;H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L27/10
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