发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a manufacturing method for a semiconductor device that enables a wiring structure to be formed by a low-cost process, the wiring structure connecting to the backside, and the semiconductor device. <P>SOLUTION: The manufacturing method of this invention for a semiconductor device includes a half-cut step of doing half-cut dicing on a scribe area from the front surface side, where an element region 101 of a silicon substrate 100 is formed, to form a groove in the silicon substrate 100, a protection film formation step of forming a protection film on the surface where the groove is to be cut, a metal film formation step of forming a metal film on the silicon substrate 100's front surface side, a wiring structure formation step of patterning a metal film to form a wiring structure, and a grinding step of grinding the backside of the substrate 100 to expose the wiring structure at the backside. <P>COPYRIGHT: (C)2007,JPO&INPIT</p>
申请公布号 JP2007123756(A) 申请公布日期 2007.05.17
申请号 JP20050317264 申请日期 2005.10.31
申请人 TECHNOLOGY ALLIANCE GROUP INC 发明人 OYAMADA SHIGEMASA
分类号 H01L21/3205;H01L21/301;H01L23/12;H01L23/48;H01L23/52 主分类号 H01L21/3205
代理机构 代理人
主权项
地址