CIRCUIT DESIGN SYSTEM AND PROGRAM

摘要

PROBLEM TO BE SOLVED: To provide a circuit design system capable of facilitating failure analysis efficiently with fewer observation points. SOLUTION: This circuit design system is provided with a storage part, a failure candidate extraction part, a determination part, and an observation point insertion part. The storage part stores a net list NET. The failure candidate extraction part extracts equivalent failure groups G1-GI(I represents an integer not less than 1) from the net list NET and generates failure candidate data CAN showing the equivalent failure group Gi(i represents an integer not less than 1 and not more than I). The equivalent failure group Giincludes a plurality of nodes Ni1-NiJi(Jimeans the number of nodes included in the equivalent failure group Gi). The determination part 111 decides a target node, to which the observation point used for failure analysis is inserted, from a plurality of nodes Ni1-Niji. In this process, the determination part decides the target node based on the number of nodes Ji. The observation point insertion part inserts one or more observation points to the target node for updating the net list NET. COPYRIGHT: (C)2007,JPO&INPIT