发明名称 |
High-Speed Transceiver Tester Incorporating Jitter Injection |
摘要 |
A tester for testing high-speed serial transceiver circuitry. The tester includes a jitter generator that uses a rapidly varying phase-selecting signal to select between two or more differently phased clock signals to generate a phase-modulated signal. The phase-selecting signal is designed to contain low-and high-frequency components. The phase-modulated signal is input into a phase filter to filter unwanted high-frequency components. The filtered output of the phase filter is input into a data-transmit serializer to serialize a low-speed parallel word into a high-speed jittered test pattern for input into the transceiver circuitry.
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申请公布号 |
US2007113119(A1) |
申请公布日期 |
2007.05.17 |
申请号 |
US20060553035 |
申请日期 |
2006.10.26 |
申请人 |
HAFED MOHAMED M;LABERGE SEBASTIEN;PISHDAD BARDIA;TAM CLARENCE K L |
发明人 |
HAFED MOHAMED M.;LABERGE SEBASTIEN;PISHDAD BARDIA;TAM CLARENCE K.L. |
分类号 |
G11B20/20;G06K5/04;G11B5/00 |
主分类号 |
G11B20/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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