Semiconductor device, test board, test system of semiconductor device, and test method of semiconductor device,申请号KR20050062368-传众专利搜索

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发明名称	Semiconductor device, test board, test system of semiconductor device, and test method of semiconductor device
摘要
申请公布号	KR100714482(B1)	申请公布日期	2007.05.04
申请号	KR20050062368	申请日期	2005.07.11
申请人		发明人
分类号	G01R31/28	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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