METHOD FOR TESTING STAND-BY CURRENT OF SEMICONDUCTOR PACKAGE,申请号KR20050005071-传众专利搜索

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发明名称	METHOD FOR TESTING STAND-BY CURRENT OF SEMICONDUCTOR PACKAGE
摘要
申请公布号	KR20060084272(A)	申请公布日期	2006.07.24
申请号	KR20050005071	申请日期	2005.01.19
申请人	SAMSUNG ELECTRONICS CO., LTD.	发明人	SIM, MOON BO;KWAK, JOO SEOK;KIM, SEONG SU;YANG, YUN BO;KIM, SUN KI
分类号	G01R19/165	主分类号	G01R19/165
代理机构		代理人
主权项
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