发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 A semiconductor device includes an interlevel insulating film disposed on a semiconductor substrate and having an opening formed therein. An interconnection main layer, which contains Cu as a main component, is embedded in the opening. A barrier film is interposed between the interlevel insulating film and the interconnection main layer within the opening. The barrier film contains, as a main component, a compound of a predetermined metal element with a component element of the interlevel insulating film.
申请公布号 KR20060042167(A) 申请公布日期 2006.05.12
申请号 KR20050015478 申请日期 2005.02.24
申请人 SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTER 发明人 KOIKE JUNICHI;WADA MAKOTO;TAKAHASHI SHINGO;SHIMIZU NORIYOSHI;SHIBATA HIDEKI;NISHIKAWA SATOSHI;USUI TAKAMASA;NASU HAYATO;YOSHIMARU MASAKI
分类号 H01L21/28;H01L21/3205;H01L21/768;H01L23/48;H01L23/52;H01L23/532 主分类号 H01L21/28
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