发明名称 |
SULFONIC-ESTER-CONTAINING COMPOSITION FOR FORMATION OF ANTIREFLECTION FILM FOR LITHOGRAPHY |
摘要 |
<p>An antireflection film suitable for use in lithography process using light, such as ArF excimer laser or F2 excimer laser, that is high in the effect of prevention of reflection light, being free from intermixing with photoresist, and that exhibits an etching rate greater than that of photoresist, being capable of forming a photoresist pattern with no footing figuration at its underpart; and a composition for formation of antireflection film for lithography that is suitable for formation of the antireflection film. There is provided a composition for formation of antireflection film for lithography, comprising a polymer compound, a crosslinking compound, a crosslinking catalyst, a sulfonic ester compound and a solvent.</p> |
申请公布号 |
WO2006049045(A1) |
申请公布日期 |
2006.05.11 |
申请号 |
WO2005JP19612 |
申请日期 |
2005.10.25 |
申请人 |
NISSAN CHEMICAL INDUSTRIES, LTD.;KISHIOKA, TAKAHIRO;HATANAKA, TADASHI;KIMURA, SHIGEO |
发明人 |
KISHIOKA, TAKAHIRO;HATANAKA, TADASHI;KIMURA, SHIGEO |
分类号 |
G03F7/11;C08G59/14;H01L21/027 |
主分类号 |
G03F7/11 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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