发明名称 SULFONIC-ESTER-CONTAINING COMPOSITION FOR FORMATION OF ANTIREFLECTION FILM FOR LITHOGRAPHY
摘要 <p>An antireflection film suitable for use in lithography process using light, such as ArF excimer laser or F2 excimer laser, that is high in the effect of prevention of reflection light, being free from intermixing with photoresist, and that exhibits an etching rate greater than that of photoresist, being capable of forming a photoresist pattern with no footing figuration at its underpart; and a composition for formation of antireflection film for lithography that is suitable for formation of the antireflection film. There is provided a composition for formation of antireflection film for lithography, comprising a polymer compound, a crosslinking compound, a crosslinking catalyst, a sulfonic ester compound and a solvent.</p>
申请公布号 WO2006049045(A1) 申请公布日期 2006.05.11
申请号 WO2005JP19612 申请日期 2005.10.25
申请人 NISSAN CHEMICAL INDUSTRIES, LTD.;KISHIOKA, TAKAHIRO;HATANAKA, TADASHI;KIMURA, SHIGEO 发明人 KISHIOKA, TAKAHIRO;HATANAKA, TADASHI;KIMURA, SHIGEO
分类号 G03F7/11;C08G59/14;H01L21/027 主分类号 G03F7/11
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