| 摘要 |
A method and a device for measuring internal information of a scattering absorber, wherein a pulsed light with a plurality of specified wavelengths or a modulated light with a plurality of specified frequencies is shone into a scattering absorber (1) to be measured from a light source (5), an outgoing light is detected by a photodetector (7), and then internal information is operated and calculated by a signal processing unit (8) and a processing unit (9), whereby internal information of the scattering absorber is obtained by calculating an absorption coefficient difference, by a spectroscopic measuring method (MVS method) using an optical path length average and dispersion or equivalent physical quantities and by utilizing an MBL low-based time-resolved integration measuring (TIS) method and a phase modulation measuring (PMS) method to thereby enable high-accuracy, high-speed measurement of internal information of a scattering absorber (1). <IMAGE> |
