发明名称 MANUFACTURING METHOD OF WAFER STRUCTURE HAVING STRAINED SILICON LAYER, AND INTERMEDIATE PRODUCT OF THE METHOD
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method capable of efficiently manufacturing a wafer structure, having a strained silicon layer and capable of recycling a donor or a support substrate for use, with high reproducibility and intermediate products. <P>SOLUTION: The manufacturing method of the wafer structure having the strain silicon layer is provided with the support substrate 1 and includes a process that supplies a molding wafer, having a strain silicon model layer 3 on an upper surface; a process that epitaxially grows a strain-relaxed auxiliary SiGe layer 8 on the strain silicon model layer 3; a process that epitaxially grows a strain silicon active layer 11 on the strain-relaxed auxiliary SiGe layer 8; and a process that separates the structure at a predetermined separation region 9 produced in the auxiliary SiGe layer 8. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p>
申请公布号 JP2006121055(A) 申请公布日期 2006.05.11
申请号 JP20050270891 申请日期 2005.09.16
申请人 SOI TEC SILICON ON INSULATOR TECHNOLOGIES SA 发明人 LE VAILLANT YVES-MATTHIEU
分类号 H01L21/20;H01L21/308 主分类号 H01L21/20
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