发明名称 PLASMA ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a plasma etching method by which a metal film as a material to be etched can be selectively etched to an organic film underlying the material to be etched. SOLUTION: In the etching method, an etching gas is introduced into an etching chamber in which the material to be etched is set, the material to be etched is etched by exciting the etching gas to a plasma state, and the material to be etched is the metal film 3 composed of Au, Pt, Ag, Ti, TiN, TiO, Al, and an aluminum alloy which are laminated to the organic film 5 or a laminated film formed of the films of the metals. The etching gas is a mixed gas to which at least one kind of gas selected from among Cl<SB>2</SB>, BCl<SB>3</SB>, and HBr and at least one kind of gas selected from among CH<SB>2</SB>Cl<SB>2</SB>, CH<SB>2</SB>Br<SB>2</SB>, CH<SB>3</SB>Cl, CH<SB>3</SB>Br, CH<SB>3</SB>F, and CH<SB>4</SB>are added. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006120983(A) 申请公布日期 2006.05.11
申请号 JP20040309506 申请日期 2004.10.25
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 FUJIMOTO KOTARO;SHIMADA TAKESHI
分类号 H01L21/3065 主分类号 H01L21/3065
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