发明名称 |
Test time forecast system and method thereof |
摘要 |
A system and method thereof for test time forecasting. The system comprises a storage device and a first program module. The storage device stores Circuit Probing (CP) test records individually storing information regarding a test time and a yield of a test unit corresponding to a test program. The first program module receives the CP test records and generates a new test time forecast model according to the CP test records. The new test time forecast model determines a dependent variable corresponding to the test time by utilizing an independent variable corresponding to the yield.
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申请公布号 |
US2006100844(A1) |
申请公布日期 |
2006.05.11 |
申请号 |
US20040983817 |
申请日期 |
2004.11.08 |
申请人 |
YANG KENG-CHIA;HUANG YI-SHENG;YU BEN-HUI;HSIEH CHUNG-LIN;WANG CHIEN-WEI;YANG TSUNG-HSIN;HUANG TZU-CHENG |
发明人 |
YANG KENG-CHIA;HUANG YI-SHENG;YU BEN-HUI;HSIEH CHUNG-LIN;WANG CHIEN-WEI;YANG TSUNG-HSIN;HUANG TZU-CHENG |
分类号 |
G06F13/10 |
主分类号 |
G06F13/10 |
代理机构 |
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代理人 |
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地址 |
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