| 摘要 |
There is provided a pattern generation device for generating a test pattern for performing a scan test of an electronic device. The pattern generation device includes: a main memory for correlating a scan pattern data block containing pattern data for performing a scan test to a scan sequence data block containing an instruction indicating the sequence for supplying data of the scan pattern data block to the electronic device and storing them; and a data spreading section for executing the instruction in the scan sequence data block so as to spread pattern data in the corresponding scan pattern data block, thereby generating a test pattern.
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