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发明名称
PICK AND PLACE OF SEMICONDUCTOR TEST APPARATUS
摘要
申请公布号
KR20060036326(A)
申请公布日期
2006.04.28
申请号
KR20040085503
申请日期
2004.10.25
申请人
TECHWING CO., LTD.
发明人
SHIM, JAE GYUN;NA, YUN SUNG;GU, TAE HUNG
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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